Design, Preparation and Characterization of Mid-infrared Low-emissivity Film

Abstract The rapid development of infrared detection technology requires that military targets have mid-infrared stealth performance. In this paper, a low-emissivity film based on one-dimensional photonic crystal structure was designed and prepared. results showed its reflectivity properties are improved total thickness is reduced by optimizing the construction parameters. refractive index prepared Ge ZnSe were tested using IR ellipsometer. After test brought into structure, films with emissivity 0.032, 0.068, 0.146, 0.203 0.366 vacuum evaporation. Fourier spectrometer, in good agreement calculated results.